Rietveld Refinement
Overview
Perform whole-pattern least-squares Rietveld refinement to extract quantitative structural and microstructural parameters from multiphase powder diffraction data.
Scientific Background
Rietveld refinement simultaneously fits all parameters of a structural model to the entire measured diffraction pattern. The refinement minimizes the difference between observed and calculated profiles by adjusting scale factors, lattice parameters, profile shape coefficients (Caglioti U, V, W), zero-shift, background polynomial, and site occupancies. Quality is assessed through R_wp, R_p, R_exp, and the goodness-of-fit (GoF) ratio.
Workflow
Complete the analysis pipeline through peak detection and phase identification
Select candidate phases identified during phase identification
Choose refinement workflow (auto or manual CIF upload)
Run Rietveld refinement with profile shape modeling (Pseudo-Voigt)
Review fit quality metrics (R_wp, R_p, R_exp, χ², GoF)
Export refined parameters, phase fractions, and calculated patterns