Our Services
Comprehensive suite of scientific tools for X-ray diffraction analysis and materials characterization.
XRD Pattern Analysis
Upload and analyze powder X-ray diffraction patterns with automated background correction, Kα2 stripping, and noise reduction.
Phase Identification
Automatically match experimental diffraction patterns against crystallographic databases including the Crystallography Open Database.
Rietveld Refinement
Perform least-squares Rietveld refinement to extract lattice parameters, phase fractions, and structural details from multiphase samples.
Reference Database Search
Search the Crystallography Open Database and a curated local database of 50+ common crystalline materials with pre-computed diffraction peaks.
CIF Processing
Upload and parse Crystallographic Information Files to extract crystal structures, unit cell parameters, and atomic positions.
Crystal Structure Visualization
Visualize crystal structures in 3D with unit cell parameters, space group information, and atomic positions from CIF data.
Scientific Report Generation
Generate publication-quality PDF reports with diffraction pattern figures, analysis tables, methodology descriptions, and Rietveld results.