Characterization Module
Energy Dispersive X-ray Spectroscopy (EDS/EDX)
Elemental analysis and mapping for compositional characterization of materials
EDS/EDX
Coming SoonEnergy dispersive X-ray spectroscopy detects characteristic X-rays emitted from a sample under electron excitation, enabling elemental identification and quantitative compositional analysis. When coupled with SEM or TEM, it provides spatially resolved elemental mapping.
Expected Features
Planned capabilities for this moduleElemental identification from X-ray spectra
Quantitative composition via ZAF corrections
Elemental mapping and line scans
Spot analysis for targeted composition
Spectrum deconvolution and peak overlap correction
Light element detection (B through U)
This characterization module is under active development. It will integrate seamlessly with the MatPilot platform to provide a complete materials characterization workflow.