Characterization Module
X-ray Photoelectron Spectroscopy (XPS)
Surface chemical analysis for oxidation states and elemental composition
XPS
Coming SoonXPS, also known as Electron Spectroscopy for Chemical Analysis (ESCA), measures the binding energy of core-level electrons ejected by X-ray irradiation. It provides quantitative elemental composition and chemical state information from the top 1–10 nm of a material surface.
Expected Features
Planned capabilities for this moduleCore-level peak fitting and chemical state assignment
Quantitative surface elemental composition
Depth profiling via angle-resolved XPS
Chemical state mapping and imaging
Charge referencing and calibration tools
Automated peak identification and reporting
This characterization module is under active development. It will integrate seamlessly with the MatPilot platform to provide a complete materials characterization workflow.