Characterization Module
Transmission Electron Microscopy (TEM)
Atomic-resolution imaging for internal microstructure and crystallographic characterization
TEM
Coming SoonTransmission electron microscopy transmits a high-energy electron beam through an ultrathin specimen, achieving atomic-resolution imaging of internal structures, crystal lattices, and defects. Combined with diffraction and spectroscopy, it provides comprehensive nanostructural characterization.
Expected Features
Planned capabilities for this moduleHigh-resolution TEM (HRTEM) lattice imaging
Selected area electron diffraction (SAED)
Bright-field and dark-field imaging modes
Crystal structure determination from diffraction patterns
Nano-particle size and morphology analysis
Energy-filtered TEM for elemental distribution
This characterization module is under active development. It will integrate seamlessly with the MatPilot platform to provide a complete materials characterization workflow.