Characterization Module
Scanning Electron Microscopy (SEM)
High-resolution surface imaging for morphological and microstructural characterization
SEM
Coming SoonScanning electron microscopy provides detailed surface morphology and topography information by scanning a focused electron beam across a sample. Secondary and backscattered electron signals reveal microstructural features from nanometer to millimeter scales.
Expected Features
Planned capabilities for this moduleHigh-resolution secondary electron (SE) imaging
Backscattered electron (BSE) compositional contrast
Automated image stitching and tiling
Particle size and distribution analysis
Image processing with thresholding and segmentation
Automated measurement and annotation tools
This characterization module is under active development. It will integrate seamlessly with the MatPilot platform to provide a complete materials characterization workflow.